Get current pricing for Tencor, SURFSCAN 6200 Wafer Surface Analysis System For Non-patterned Wafers. Can Accommodate Wafers From 2 To 8 In. Dia. Sensitivity - Particle: .117 Micro-meter Dia. Late . Product Category: Semiconductor, Sub Category::

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Manufacturer: Tencor Part number: SURFSCAN 6200 Description: Wafer Surface Analysis System For Non-patterned Wafers. Can Accommodate Wafers From 2 To 8 In. Dia. Sensitivity - Particle: .117 Micro-meter Dia. Late . Product Category: Semiconductor, Sub Category:

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Manufacturer: Tencor Part number: SURFSCAN 6200 Description: Wafer Surface Analysis System For Non-patterned Wafers. Can Accommodate Wafers From 2 To 8 In. Dia. Sensitivity - Particle: .117 Micro-meter Dia. Late . Product Category: Semiconductor, Sub Category: